Design-Reuse

Genesys Testware announces Bscanmaker for the simultaneous insertion of boundary scan and pad rings into a SoC

FREMONT, California, June 19, 2002— Genesys Testware, Inc., a leading supplier of embedded test solutions, announced today the availability of their latest product BSCANmakerTM. BSCANmaker ...
Design-Reuse

Genesys Testware adds efficient automated insertion of embedded test and repair circuits for memory

Fremont, California, June 3, 2005 — Genesys Testware, Inc., a leading supplier of yield, quality and cost optimization tools for nanometer ICs, announced today the addition of efficient automated ...
InfoQ

Open Source Testware for Systematic IoT Testing: Eclipse IoT-Testware

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Andres Almiray, a serial open-source ...
EDN

Genesys Testware adds capabilities to ArraytestMaker

SAN FRANCISCO — Genesys Testware Inc. has added efficient automated insertion of embedded test and repair circuits for memory into system IC designs to it's ArraytestMaker product, the company said ...