A new research review looks at how computer vision and machine learning could be used to spot defects in 3D printed concrete.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Defect-engineered zinc oxide converts tiny reversible strains into near-infrared light, opening a rare-earth-free path to ...

Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...

An international research team has proposed a perovskite solar cell architecture incorporating a thin tetraphenyl-porphine ...