Two new Omron automated optical inspection (AOI) systems have been released: the VT-Z600 and VT-S1040. The VT-Z600 is Omron’s fastest pre/post reflow AOI system. It features multi-direction and ...
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Check out the full article here: https://www.oejournal.org/oea/article/doi/10.29026/oea.2025.240299 In contrast, non-interferometric methods—such as structured ...
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Metrology and wafer inspection processes are changing to keep up with evolving and new device applications. While fab floors still have plenty of OCD tools, ellipsometers, and CD-SEMs, new systems are ...
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